SEM, EDS, TEM, AND RAMAN ANALYSIS
Avomeen utilizes a wide variety of microscopy analyses and deliver quick and accurate results.
Avomeen’s Ph.D. scientists and experienced technicians use these microscopy methods and instrumentation, along with the full capabilities of our testing facilities, to understand important chemical and structural information related to your samples.
Available Microscopy Analyses:
- Scanning Electron Microscopy (SEM)
- Energy Dispersive X-ray Spectroscopy (EDS)
- Transmission Electron Microscopy (TEM)
- Optical/Stereo Microscopy
- Raman Microscopy
We keep our labs equipped with advanced microscopic analysis technologies so that our well-trained and experienced scientists are ready to take on analyses relevant to industries worldwide. Take advantage of our available electron & optical microscopy services for:
- Polymers, Plastics & Packaging
- Films & Coatings
- Contaminant Research
- Mineral & Raw Material Analysis
- Consumer Product Safety & Quality
If your analysis requires high-resolution imaging of microscopic materials and substances, seek help from our scientists skilled in such microscopic analyses as:
Scanning Electron Microscope (SEM Analysis)
A Scanning Electron Microscope (SEM) is a microscope that uses electrons – instead of light – to form an image of a sample in a raster scan pattern to document the structure and morphology of a sample. These Electrons from the SEM Analysis interact with the atoms from within the sample to produce an output that details the composition of the sample, surface topography, electrical conductivity, and a variety of other properties.
Avomeen uses a high-resolution SEM with a large depth of field to record closely-spaced specimens at high magnification and sharp focus, resulting in detailed magnified pictures of incoming samples. We can also accommodate a range of specific storage conditions, coating requirements, and sample preparation to produce a higher quality image.
Energy-Dispersive X-Ray Analysis (EDXA Testing):
EDXA is an analytical technique used for the elemental analysis or chemical characterization of a sample that relies on the interaction between a sample and X-ray excitation. When connected to a Scanning Electron Microscope, EDXA is able to rapidly perform elemental analyses on different areas of the sample, which can provide information regarding the sample composition.
Scanning Electron Microscopy/Energy Dispersive X-ray Spectroscopy Analysis (SEM/EDS)
Avomeen’s SEMTech Model 1830 SEM/EDS (pictured above) is equipped with new technologies, including EDS electronics and digital imaging, an IR chamber scope, gold-tungsten sputter coater, and quantitative x-ray spectrum analysis with auto-detection. Our scientists utilize this instrument to generate high-resolution images of samples in the micrometer and nanometer ranges, in addition to performing elemental scans on any region of the sample.
- Product Reverse Engineering (Deformulation)
- Product Failure Analysis
- Material Testing & Identification
- R&D Product Development
- Method Development & Validation
- Litigation Support Services
Two sample SEM images (at 380x and 1500x) are displayed below:Figure 1: Edge of a used blade from a razor at 1500x magnification Figure 2: The eye of a fly at 380x magnification