Proton Induced X-Ray Emission (PIXE) Analysis
Proton Induced X-Ray Emission (PIXE): PIXE is a technique used to determine the elemental composition of a sample. PIXE is a non-destructive approach to pass an ion beam on a small part of a sample’s surface to excite the atom.
The accelerated atom will give off electromagnetic radiation of wavelengths in the X-Ray light spectrum that is characteristic of a particular element.
The detection limits of PIXE are in the half parts-per-million (PPM) level with +/-10% accuracy. Our chemists can develop a custom project using PIXE analysis along with a range of other techniques and instrumentation to solve your complex analytical needs.