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Proton Induced X-Ray Emission (PIXE) Analysis

pixe analysisProton Induced X-Ray Emission (PIXE): PIXE is a technique used to determine the elemental composition of a sample. PIXE is a non-destructive approach to pass an ion beam on a small part of a sample’s surface to excite the atom.

The accelerated atom will give off electromagnetic radiation of wavelengths in the X-Ray light spectrum that is characteristic of a particular element.

The detection limits of PIXE are in the half parts-per-million (PPM) level with +/-10% accuracy.  Our chemists can develop a custom project using PIXE analysis along with a range of other techniques and instrumentation to solve your complex analytical needs.


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Problem Solving
Avomeen scientists utilize the latest techniques, instrumentation, and methods to analyze a wide variety of complex testing challenges.
Customer Service
Our whole team is committed to completing each customer's project to their exact specifications, including custom methods and rush services.
Instrumentation
Avomeen's investigations include the use of FT-IR, GC/MS, LC/MS, HPLC, NMR, SEM/EDXA, ICP, AA, TGA, DSC, and many other techniques.
Contact Us
Avomeen Analytical Services
4840 Venture Drive
Ann Arbor, MI 48108
Phone: 1-800-930-5450
Fax: 1-800-930-5479
Email: info@avomeen.com