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Proton Induced X-Ray Emission (PIXE) Analysis

pixe analysisProton Induced X-Ray Emission (PIXE): PIXE is a technique used to determine the elemental composition of a sample. PIXE is a non-destructive approach to pass an ion beam on a small part of a sample’s surface to excite the atom.

The accelerated atom will give off electromagnetic radiation of wavelengths in the X-Ray light spectrum that is characteristic of a particular element.

The detection limits of PIXE are in the half parts-per-million (PPM) level with +/-10% accuracy.  Our chemists can develop a custom project using PIXE analysis along with a range of other techniques and instrumentation to solve your complex analytical needs.

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Problem Solving
Avomeen scientists utilize the latest techniques, instrumentation, and methods to analyze a wide variety of complex testing challenges.
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Our whole team is committed to completing each customer's project to their exact specifications, including custom methods and rush services.
Avomeen's investigations include the use of FT-IR, GC/MS, LC/MS, HPLC, NMR, SEM/EDXA, ICP, AA, TGA, DSC, and many other techniques.
Contact Us
Avomeen Analytical Services
4840 Venture Drive
Ann Arbor, MI 48108
Phone: 1-800-930-5450
Fax: 1-800-930-5479