Avomeen utilizes a wide range of microscopy analyses, from optical to electron microscopy. We deliver quick, confidential, and accurate results. Avomeen’s Ph.D. scientists and experienced technicians use these microscopy methods and instrumentation, along with the full capabilities of our testing facilities, to develop an understanding of important chemical and structural information related to your samples.
Scanning Electron Microscopy/Energy Dispersive X-ray Spectroscopy Analysis (SEM/EDS)
Avomeen has recently installed a SEMTech Model 1830 SEM/EDS (pictured above) equipped with new technologies – including Windows 7 EDS Electronics and Digital Imaging, an IR Chamber Scope, Gold-Tungsten Sample Coater, and Quantitative X-ray Spectrum Analysis with auto-detection. With this system, our scientists can generate high-resolution images of samples in the micrometer and nanometer ranges, then perform elemental scans on any region of the sample.
Scanning Electron Microscope (SEM Analysis)
SEM is a microscope that uses electrons instead of light to form an image of a sample in a raster scan pattern by utilizing a beam of electrons which documents a samples morphology and structure. The scanning electron microscope has many advantages over traditional microscopes. Avomeen uses SEM technology to gain detailed magnified pictures of incoming samples.
These Electrons from the SEM Analysis interact with the atoms from within the sample to produce an output that shows the samples composition, surface topography, electrical conductivity, as well as a variety of other properties. Some samples have to be kept in specific states to be tested properly, or coated and prepared to produce a higher quality image.
We use a high resolution SEM with a large depth of field, which allows our scientists to record closely-spaced specimens at high magnification and sharp focus.
Energy-Dispersive X-Ray Analysis (EDXA Testing):
EDXA is an analytical technique used for the elemental analysis or chemical characterization of a sample by relying on the interaction studied between a sample and X-ray excitation. When connected to a Scanning Electron Microscope, it is able to rapidly perform elemental analyses on different areas of the sample.
A detector is used to convert X-ray energy into voltage signals; this information is sent to a pulse processor, which measures the signals and passes them onto an analyzer for data display and analysis. The result is peaks in the EDS spectrum which are measured and recorded, giving clues to the ingredients and elemental analysis of a sample.
Two sample SEM images (at 380x and 1500x) are displayed below:Figure 1: Edge of a used blade from a razor at 1500x magnification Figure 2: The eye of a fly at 380x magnification
Contact one of our technical directors today at (800) 930-5450 or Request an Online Quote to get your testing project started.